An overview of emerging international measurement standards in electromagnetic compatibility for integrated circuits

摘要

The characterization of the electromagnetic compatibility (EMC) performance of integrated circuits (ICs) is receiving increasing focus as new applications and technology trends combine to raise the complexity of EMC compliance. The increased focus is driving the need for standardized measurement procedures to enable comparison of different devices. This paper describes the work in process by IEC TC47/SC47A Working Group 9 to standardize emissions and immunity EMC test methods for integrated circuits. The two standards currently in development for RF radiated and conducted emissions, as well as their status, are discussed.