Defect Characterization: A Low Cost Rapid Response Approach

摘要

A reliable rapid defect characterization process is essential to eliminating defects in coating and converting operations. Analytical data about the nature of the defect will help solve the problem, if it is obtained in a timely manner. Often the analytical process is slow and the data is obtained well after the defect has gone away and does not help the defect elimination. A rapid convenient process can also be used more frequently and prevent a low defect level from escalating. This paper will present some techniques that can be used to rapidly and accurately characterize defects. Advantages of these techniques are that they: 1. Do not require expensive instrumentation 2. Provide rapid useful information 3. Can be used by operating personnel Topics to be covered are: 1. Analytical characterization techniques 2. Basic defect measurements 3. Microscopic characterization techniques 4. The role of computer technology 5. Case studies of some typical defects, spots chatter, roll repeats, etc