Single and multiple fault diagnosis based on symbolic analysis and reduced set of observable points for linear analog circuits

摘要

This paper is intended to show the possibility of performing fault location and identification in the case of single or double faults for analog circuits with a symbolic algorithm that allows one to use few observable points. A group of test equations, obtained from the symbolic solution of the circuit, is cyclically solved in turn for each group of parameters under test, leaving the others at their rated value. A validation equation, still obtained from the same symbolic solution, has the task to validate the faulty or non-faulty situation for those parameters.