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ESD testing of head stack assemblies used in magnetic recording hard disk drives

机译:磁记录硬盘驱动器中使用的磁头堆栈组件的ESD测试

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ESD testing of the head stack assembly used in hard disk drives is described. Testing using an IEC 801-2 simulator as well as a field-induced model are described. Results show that GMR heads can be magnetically damaged as low as 150V using an ESD gun. GMR heads on an HSA can be damaged magnetically and their resistance can be increased, in spite of the fact that the preamplifier is between the GMR heads and the connector. It is concluded that it is important and interesting to do ESD testing of head stack assembles and that some HSA designs may require some degree of ESD control in a manufacturing environment if ESD damage is to be avoided.
机译:描述了硬盘驱动器中使用的磁头堆栈组件的ESD测试。描述了使用IEC 801-2仿真器以及现场感应模型进行的测试。结果表明,使用ESD喷枪可以将GMR磁头损坏至低至150V。尽管前置放大器位于GMR磁头和连接器之间,但HSA上的GMR磁头可能会受到磁损坏,并且其电阻会增加。结论是对磁头堆栈组件进行ESD测试是重要且有趣的,如果要避免ESD损坏,某些HSA设计可能需要在制造环境中进行一定程度的ESD控制。

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