首页> 外文会议>Conference on thermosense >Infrared thermography in electronics a
【24h】

Infrared thermography in electronics a

机译:电子产品中的红外热成像

获取原文

摘要

Abstract: Thermal engineering of electronics products has become more essential, mainly because of increasing power densities due to the past rate of miniaturization at all assembly levels. One tool, which facilitates this challenging work, is infrared (IR) thermography. With an IR camera, it is often quite easy to quickly inspect an electronic device, or usually printed circuit board (PCB), by detecting and locating possible hot spots. However, due to the relative ease of use of modern IR cameras equipped with diverse special functions, it is also rather easy to make serious misinterpretations. Typical pitfalls that arise in electronics applications include considerable emissivity variations, for instance on common PCB's and the sometimes-drastic changes of operation conditions when the device under test is removed from its operational environment to allow imaging. In this paper, these pitfalls, their effects, and the feasibility of possible remedies are discussed. !8
机译:摘要:电子产品的热工程已经变得越来越重要,这主要是由于过去在所有组装级别的小型化率导致功率密度的增加。红外(IR)热成像是促进这项艰巨工作的一种工具。使用红外摄像机,通过检测和定位可能的热点,通常非常容易快速检查电子设备或通常是印刷电路板(PCB)。但是,由于配备了各种特殊功能的现代红外热像仪相对易于使用,因此很容易造成严重的误解。在电子应用中出现的典型缺陷包括发射率的巨大变化,例如在常见的PCB上,以及当将被测设备从其操作环境中取出以进行成像时,操作条件有时会发生剧烈变化。在本文中,讨论了这些陷阱,其影响以及可能采取的补救措施的可行性。 !8

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号