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ONE-SHOT INTERFEROMETER WITH SIMULTANEOUS RECORDING OF THE SIGNAL INTENSITY

机译:同时记录信号强度的一键式干涉仪

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With interferometry it is only possible to determine the phase difference ΔΦ between two coherent waves S (signal) and R (reference) directly from the interferogram IF if the intensities of the waves are known. In some cases (dynamic processes) the signal intensity is not known. A system is presented that measures the intensity distribution of S and IF simultaneously on different parts of a camera detector with one shot.All elements of this system are combined in a compact module that can be mounted on a standard camera. So, all information to determine the phase difference is acquired within one shot (with a known reference wave).An example is shown for measuring the wave front of a phase-conjugated signal generated in a photorefractive Bi_(12)TiO_(20) crystal.
机译:利用干涉测量法,如果已知波的强度,则只能直接从干涉图IF确定两个相干波S(信号)和R(参考)之间的相位差ΔΦ。在某些情况下(动态过程),信号强度未知。提出了一种可以一次测量相机检测器不同部分的S和IF强度分布的系统。 该系统的所有元素都组合在一个紧凑的模块中,该模块可以安装在标准相机上。因此,所有确定相位差的信息都在一次发射中获得(使用已知参考波)。 示出了一个示例,用于测量在光折射Bi_(12)TiO_(20)晶体中生成的相位共轭信号的波前。

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