首页> 外文会议>Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE >Measurement of tribo and corona charging features of materials for assessment of risks from static electricity
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Measurement of tribo and corona charging features of materials for assessment of risks from static electricity

机译:测量材料的摩擦和电晕充电特性以评估静电风险

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Many of the risks from static electricity arise in relation to the maximum surface voltage that may arise when materials are rubbed. The paper describes a new approach for assessing the risks presented by static charge retained on materials by simultaneous measurements of the quantity of charge transferred, the initial peak voltage generated and the rate at which the charge can decay away. The quantity of charge transferred divided by the initial peak voltage is equivalent to a capacitance. If this 'capacitance loading' is large then only low surface voltages will occur with practical quantities of charge transfer, and static problems are unlikely to arise from charge retained on the material itself. This approach provides a necessary addition to assessment of materials by the charge decay time when charge decay times are long.
机译:与静电有关的许多风险与摩擦材料时可能产生的最大表面电压有关。本文介绍了一种通过同时测量转移的电荷量,产生的初始峰值电压和电荷衰减速率来评估残留在材料上的静电荷所带来的风险的新方法。转移的电荷量除以初始峰值电压就等于一个电容。如果这种“电容负载”很大,那么在实际的电荷转移量下只会产生低的表面电压,并且材料本身所保留的电荷不太可能引起静态问题。当电荷衰减时间很长时,此方法为通过电荷衰减时间评估材料提供了必要的补充。

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