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Theoretical study for detection of defects in weakly absorbing samples by crossed-beam photothermal technique

机译:交叉光束光热技术检测弱吸收样品中缺陷的理论研究

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The photothermal techniques have been successfully applied as tools for nondestructive evaluation (NDE) of inhomogeneous materials. For optically opaque samples, photothermal techniques are widely used for detection and characterization of subsurface defects and interfaces within the samples [1,2]. For optically transparent samples, photothermal techniques are used for absorption mapping of thin films deposited on optical substrates [3], biological and medical samples [4]. Due to nondestructive micro-analyses is very important for studies of thin films and interfaces, as well as biological, and medical samples.
机译:已经成功地应用于非均匀材料的非破坏性评价(NDE)的工具。对于光学不透明的样品,光热技术广泛用于样本内的地下缺陷和接口的检测和表征[1,2]。对于光学透明的样品,光热技术用于沉积在光学基材的薄膜[3],生物和医学样本[4]。由于非破坏性微分析,对研究薄膜和界面以及生物学和医学样品非常重要。

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