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Infrared imaging of temperature distribution in a high-temperature x-ray diffraction furnace

机译:高温X射线衍射炉中温度分布的红外成像

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High Temperature X-ray Diffraction (HTXRD) is a very powerful tool for studies of reaction kinetics, phase transformations, and lattice thermal expansion of advanced materials. Accurate temperature measurement is a critical part of the technique. Traditionally, thermocouples, thermisters, and optical pyrometers have been used for temperature control and measurement, and temperature could only be measured at a single point. Infrared imaging was utilized in this study to characterize the thermal gradients resulting from various sample and furnace configurations in a commercial strip heater furnace. Furnace configurations include a metallic strip heater, with and without a secondary surround heater, or surround heater alone. Sample configurations include low and high thermal conductivity powders and solids. The IR imaging results have been used to calibrate sample temperatures in the HTXRD furnace.
机译:高温X射线衍射(HTXRD)是一种非常强大的工具,用于研究先进材料的反应动力学,相变和晶格热膨胀。精确的温度测量是该技术的关键部分。传统上,热电偶,热敏电阻和光学致光学仪已被用于温度控制和测量,并且只能在单点测量温度。本研究中利用红外成像,以表征由商业条加热器炉中的各种样品和炉子配置产生的热梯度。炉子配置包括金属条带加热器,没有辅助包围式加热器,或单独使用围绕加热器。样品配置包括低温和高导热粉末和固体。 IR成像结果已被用于校准HTXRD炉中的样品温度。

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