首页> 外文会议>Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on >Thermal and acoustic pulse studies of space charge profiles in electron-irradiated fluoroethylene propylene
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Thermal and acoustic pulse studies of space charge profiles in electron-irradiated fluoroethylene propylene

机译:电子辐照氟乙烯丙烯中空间电荷分布的热和声脉冲研究

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We report complementary studies of space charge distributions in electron-beam irradiated fluoroethylene propylene (FEP) (thicknesses of 13 and 26 /spl mu/m) using the thermal pulse (TP) method and the laser-induced pressure-pulse (LIPP) method. The distributions obtained by the two methods are compared to show the strengths of both methods, the high near-surface resolution of the TP method (better than 100 nm) and the nearly constant resolution versus depth of the LIPP method (about 2 /spl mu/m). In addition to the expected implanted negative charge at a depth governed by the electron energy, a negative near-surface charge layer was found close to the metal/FEP interface if the electron beam entered the dielectric through that interface. Positive charge layers extending from both surfaces to depths (order 1 /spl mu/m) depending on the depth of the negative charges were also observed. This behavior provides new insights in the charging of dielectrics using electron beams.
机译:我们通过热脉冲(TP)方法和激光诱导的压力脉冲(LIPP)方法报告电子束照射氟乙烯丙烯(FEP)中的空间电荷分布的互补研究(FEP)(厚度为13和26 / m / m) 。将通过两种方法获得的分布进行比较,以显示两种方法的强度,TP方法的高表面分辨率(优于100nm)和LIPP方法的几乎恒定的分辨率(约2 / SPL MU) / m)。除了通过电子能量控制的深度的预期植入负电荷之外,如果电子束通过该接口进入电介质,则发现靠近金属/ FEP界面的负近表面电荷层。还观察到从两个表面延伸到深度的正电荷层,这取决于负电荷的深度。这种行为在使用电子束充电时提供了新的见解。

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