Real-time infrared test set: system design and development

摘要

Abstract: During the past several years, the technology fordesigning and fabricating thermal pixel arrays (TPAs)using silicon micromachined CMOS devices has beendeveloped adequately to support the development of areal-time infrared test set (RTIR) for sensors andseekers. The TPA is a custom application-specificintegrated circuit device that is fabricated using alow-cost commercial CMOS process. The systemarchitecture and development of the initial RTIR TestSet is described. The RTIR is a compact, self-containedtest instrument that is intended for test andevaluation of infrared systems in the field. Inaddition to the TPA, the RTIR contains projectionoptics and electronics which drive the TPA, provide TPAnonuniformity compensation, data translation, datatransformation, and user interface. The RTIR candisplay internal test patterns (static and dynamic),external digital video data, and NTSC video. Theinitial RTIR unit incorporates a 64 $MUL 64 TPA toprovide flickerless infrared scenes at 30 frames persecond. Additional TPAs are under development withformats of 128 $MUL 128, 256 $MUL 256, and 512 $MUL 512pixels.!10