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Optimum oversampling for laser-based and thermal-array scene projection methodologies

机译:基于激光和热阵列场景投影方法的最佳过采样

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Abstract: Technology effects are underway at Arnold Engineering Development Center to extend closed-loop Direct Write Scene Generation capabilities to include advanced signal-injection and thermal-array optical projection capabilities. Laser- projection for sensor optics with or without optics installed, signal-injection, and thermal-array optical projection schemes provide direct simulation of dynamic electro-optic sensor systems. FPAs and electro-optic sensors are stimulated with simulated infrared scenes for optical diagnostics and evaluation of focal plane arrays or electro- optic sensor systems, and to simulate complex mission scenarios. Closed-loop operation can provide high-fidelity simulation of complex infrared scenes, sensor optical blurring, and other temporal effects such as jitter. Although all optical stimulation and testing methods have inherent advantages, compromises, and limitations, there is a common desire to not only maximize optical simulation and photonic stimulation fidelity through advanced verification and validation efforts, but to also minimize computational requirements for high-performance diagnostics. Computational and source-to-FPA oversampling have very similar fidelity defects and requirements for signal-injection, laser- projection, and thermal-array optical projection diagnostic- methods. This paper briefly describes scene generation and projection technology and corresponding research devoted to sampling issues and criteria related to FPA oversampling, corresponding fidelity defects, and performance trades.!6
机译:摘要:Arnold工程开发中心正在发挥技术效果,以扩展闭环直接写入场景生成功能,以包括高级信号注入和热阵列光学投影功能。带有或不带有光学元件的传感器光学器件的激光投影,信号注入和热阵列光学投影方案都可以直接模拟动态电光传感器系统。通过模拟的红外场景刺激FPA和电光传感器,以进行光学诊断和评估焦平面阵列或电光传感器系统,并模拟复杂的任务场景。闭环操作可以提供对复杂红外场景,传感器光学模糊以及其他时间效应(例如抖动)的高保真模拟。尽管所有的光刺激和测试方法都具有固有的优势,折衷和局限性,但人们普遍希望不仅通过高级验证和验证工作来最大化光学模拟和光子刺激保真度,而且还要使高性能诊断的计算需求最小化。计算和源到FPA的过采样具有非常相似的保真度缺陷,并且对信号注入,激光投影和热阵列光学投影诊断方法有要求。本文简要介绍了场景生成和投影技术以及与FPA过采样,相应的保真度缺陷和性能交易有关的采样问题和准则的相应研究。!6

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