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Vacuum arc research expands interpretation of test data from vacuum interrupters

机译:真空电弧研究扩展了对真空灭弧室测试数据的解释

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Using high-speed movies of vacuum arcs between spiral contacts in conjunction with floating arc shields, the arc voltage, current and contact travel have been correlated with arc behaviors. These arc behaviors can be described by arc appearance diagrams in gap-current space. These allow the waveforms from high-power tests on spiral-contact vacuum interrupters to be evaluated for information on the internal arcing behavior and arc-induced damage. We have found that arc voltage traces can be examined during interruption testing to help in judging the probability that a vacuum interrupter will continue to pass additional interruption trials. The arc voltage also reveals signs of damage to the contacts, such as melting caused by a prolonged interval of a stationary high-current arc column. This information enhances the statistics we use in single-phase pass/fail testing of interrupters to assess manufacturing quality and the probability that new designs will pass three-phase certification. Correlation of arc voltage traces with the arc appearance and arc motion is also discussed for butt-type contacts, axial magnetic field contacts, and radial magnetic field slotted-cup contacts.
机译:通过使用螺旋触点之间的真空电弧高速影片以及浮动电弧屏蔽,可以将电弧电压,电流和触点行程与电弧行为相关联。这些电弧行为可以通过间隙电流空间中的电弧外观图来描述。这些可以评估来自螺旋接触式真空灭弧室的高功率测试的波形,以获取有关内部电弧行为和电弧引起的损坏的信息。我们发现可以在中断测试期间检查电弧电压迹线,以帮助判断真空灭弧室将继续通过其他中断试验的可能性。电弧电压还显示出触点损坏的迹象,例如由于固定的高电流电弧塔间隔时间延长而引起的熔化。这些信息增强了我们在断路器的单相通过/失败测试中使用的统计信息,以评估制造质量以及新设计通过三相认证的可能性。还讨论了对接型触头,轴向磁场触头和径向磁场槽杯形触头的电弧电压迹线与电弧外观和电弧运动的相关性。

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