Introduction to waveform recorder testing

摘要

It is shown that a wealth of information can be gathered on a waveform recorder by conducting two general tests: the sine-fit test and the step response test. The sine-fit test includes the effects of noise, nonlinearities, and aperture uncertainty but does not measure amplitude flatness or phase linearity. Sine-wave data may also be used to obtain a code-bin histogram, differential nonlinearity, and amplitude as a function of frequency. The step response yields pulse parameters (e.g. transition duration, overshoot, and settling time). In addition the step response can be used to generate amplitude and phase versus frequency, amplitude flatness, and phase linearity. The frequency response of these parameters can be extended by acquiring the step response in equivalent time mode. It may be appropriate to supplement these tests with specialized tests (e.g. aperture uncertainty) which may be important to a particular measurement.