Conference Record. IEEE Instrumentation and Measurement Technology Conference (Cat. No.90CH2735-9)

摘要

The following topics are dealt with: instrumentation for metrology; measurement techniques; microwave and noise measurements; robotic sensor technology; waveform measurements; signal analysis; waveform recorder testing; data acquisition and processing; supportability of automatic test systems; superconductivity; optical measurements; pulse standards; signal processing in measurement problems; and automatic testing (hardware and software).