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System Co-Design of a High Current (40A) Synchronous Step-Down Converter in an Innovative Multi-chip Module (MCM) LQFN-Type Packaging Technology

机译:创新的多芯片模块(MCM)LQFN型封装技术中的大电流(40A)同步降压转换器的系统协同设计

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The drive for multi-chip module (MCM) packaging technology essentially stems from the ever-increasing demand for miniaturization of power electronics. While promising, MCM packaging technologies present considerable design challenges (viz. electrical, thermal, reliability and manufacturing/assembly) if system co-design techniques are not adopted early in the design process. In this paper we present the electrical system co-design and measurement validation results of a high-efficiency, single channel, integrated FET, synchronous buck converter packaged in a 40-pin 7.00mm × 5.00mm MCM-in-LQFN-type innovative package. Due to the complex 3D level of integration of the monolithic control, drive circuitry, and the two discrete N-channel NexFETTM power MOSFETs, electromagnetic interactions, between die, package, and PCB, are exacerbated with potential impact to system-level performance. We detail here how optimization of the system, was achieved through a coupled circuit-to-electromagnetic co-design modeling and simulation methodology. Laboratory measurements on an integrated high current (40A) synchronous step-down converter are presented that validate the integrity of the co-design modeling and simulation methodology.
机译:对多芯片模块(MCM)封装技术的驱动实质上源于对功率电子器件小型化的不断增长的需求。尽管前景广阔,但如果在设计过程的早期就不采用系统协同设计技术,那么MCM封装技术将面临相当大的设计挑战(即电气,热,可靠性和制造/组装)。本文介绍了采用40引脚7.00mm×5.00mm MCM-in-LQFN型创新封装的高效,单通道,集成FET,同步降压转换器的电气系统协同设计和测量验证结果。 。由于单片控制,驱动电路以及两个分立的N沟道NexFETTM功率MOSFET的复杂3D集成级别,导致管芯,封装和PCB之间的电磁相互作用加剧,并对系统级性能产生潜在影响。我们在此详细介绍如何通过耦合的电路与电磁协同设计建模和仿真方法来实现系统的优化。提出了在集成大电流(40A)同步降压转换器上的实验室测量结果,这些数据验证了协同设计建模和仿真方法的完整性。

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