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Terahertz Time-Domain Spectroscopy Characterization of Aged XLPE Cable Insulation

机译:老化的XLPE电缆绝缘层的太赫兹时域光谱表征

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Cross-linked polyethylene (XLPE) has been widely used in high voltage power cables as insulation material due to its superior mechanical and electrical performance. Thermal aging causes irreversible chemical and morphological change that may strongly reduce the dielectric strength of XLPE, producing a limitation to the effective service life of the power cables. Therefore, it is worthwhile to monitor the aging condition of XLPE insulation so that the safety of the power system can be ensured. Terahertz technology has attracted much attention because many molecular structure information is involved in terahertz frequency. In this paper, terahertz time-domain spectroscopy (THz-TDS) was employed to study the effect of thermal aging on XLPE power cable insulation. XLPE sheets were aged at 130 °C for different periods in an air forced oven. The pristine and aged samples were studied by differential scanning calorimeter (DSC) and the crystallinity were determined. The extent of oxidation of the insulations were assessed by Fourier transform infrared (FTIR) spectroscopy. Our experimental results show that the index of refraction and relative dielectric constant in the frequency range from 0.5-2 THz increase with aging time. The aged samples show an increase in oxidation products and a decrease in the crystallinity, which indicates the molecular chain scission and oxidation. This result suggests that THz-TDS has potential to obtain information about the cable insulation condition.
机译:交联聚乙烯(XLPE)由于其优越的机械和电气性能,已被广泛用作高压电力电缆的绝缘材料。热老化会引起不可逆的化学和形态变化,这可能会大大降低XLPE的介电强度,从而限制了电源线的有效使用寿命。因此,值得监测XLPE绝缘的老化状况,以确保电力系统的安全。太赫兹技术引起了很多关注,因为太赫兹频率涉及许多分子结构信息。本文采用太赫兹时域光谱(THz-TDS)研究热老化对XLPE电力电缆绝缘的影响。 XLPE片材在空气烘箱中于130°C老化了不同的时间。用差示扫描量热仪(DSC)研究原始样品和陈化样品,并测定其结晶度。绝缘体的氧化程度通过傅立叶变换红外(FTIR)光谱法进行评估。我们的实验结果表明,在0.5-2 THz的频率范围内,折射率和相对介电常数随老化时间的增加而增加。老化的样品显示出氧化产物的增加和结晶度的下降,这表明分子链断裂和氧化。该结果表明,THz-TDS有潜力获得有关电缆绝缘状况的信息。

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