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Study on Temperature Stability and Fault Tolerance of Adder in Quantum-dot Cellular Automata

机译:量子点元胞自动机中加法器的温度稳定性和容错性研究

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Quantum-dot Cellular Automata (QCA) is the most sought after paradigms for designing layouts for digital circuits on a Nano-Scale. It has an edge over CMOS as the designs in QCA consume less power, are very small and their execution is very fast. QCA can perform computations which are dense in nature. It is being considered as a CMOS VLSI alternate. The cells in QCA transfer data based on their polarization state and the clock. For a real world implementation of QCA architecture it is crucial to know accurately about the limits on the operational environment for any given QCA design. The operation of any given QCA architecture will depend on many real world variables such as operational temperature, layer separation etc. This paper is an inference drawn from the study of a QCA design of Half Adder and Full Adder and its simulated operation under variable temperature. The study has been made on average energy dissipation, temperature stability along with fault tolerance under dislocation and vacancy of cells. The analysis is been made using QCADesignerE 2.0.3 simulation tool.
机译:量子点元胞自动机(QCA)是设计纳米级数字电路布局的最受追捧的范例。由于QCA中的设计功耗较低,非常小且执行速度非常快,因此它在CMOS方面具有优势。 QCA可以执行本质上密集的计算。它被认为是CMOS VLSI的替代品。 QCA中的单元根据其极化状态和时钟来传输数据。对于现实世界中的QCA体系结构,准确了解任何给定QCA设计对操作环境的限制至关重要。任何给定的QCA体系结构的操作都将取决于许多实际变量,例如工作温度,层分离等。本文是对Half Adder和Full Adder的QCA设计及其在可变温度下的仿真操作进行研究得出的推论。已经进行了关于平均能量耗散,温度稳定性以及在位错和单元空位下的容错性的研究。使用QCADesignerE 2.0.3仿真工具进行了分析。

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