A calibrated near field scanning system applied to the characterization of IC electromagnetic radiation

摘要

This paper presents a near field measurement system for the detection of all electromagnetic (EM) field components radiated by microwave devices. This characterization system based on the use of 4 semi-rigid coaxial probes (1 monopoly antenna, 1 differential dipole and 2 differential loops) and a controlled positioning system is power calibrated. It allows the localization of the radiation source in the RF integrated circuit (IC) and the measuring of the EM filed components amplitudes. The amplitude calibration is realized with a FR4 50 Ohms microstrip transmission line. The amplitude calibration of the system with performance factors for each probe is presented for the frequency range of [1MHz–1GHz]. A comparison between on the one hand, a 3D EM simulation of the entire probe with the standard and on the other side, the measure is presented.