Study on an Estimation Method of On-orbit Single Event Upset Rate Based on Historical Data

摘要

Single event effect is a main reliability problem for satellite in space. It is a difficult task to estimate the single event upset(SEU) rate of SRAM-based FPGA in different satellite orbits. In this paper, an estimation model of on-orbit SEU rate for FPGA is proposed, it is the sum of SEU rate induced by heavy ions and proton. The detail approaches of the model are stated, which includes five steps. The SEU rate of FPGA in different orbits are calculated and discussed. Results indicate that on-orbit SEU rate of FPGA depends mainly on heavy ions for GEO satellite and MEO satellite, and the SEU rate of FPGA in low-orbit satellite is mainly depended on proton. Compare to the orbit experiments data, the estimation model we proposed has the analytical accuracy of the same grade. The estimation model of on-orbit SEU rate for FPGA can be used to estimate the aerospace applications.