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Study on Evaluation Method of Insulator Surface Contamination Level Based on LIBS Technology and PCA Algorithm

机译:基于LIBS技术和PCA算法的绝缘子表面污染水平评估方法研究。

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As one of the most important external insulation equipment in power system, insulators play an important role in transmission and distribution network. In this paper, qualitatively and quantitatively analysis of the contaminated elements on the surface of artificial contaminated insulators and natural contaminated insulators were carried out by Laser-Induced Breakdown Spectroscopy (LIBS). For artificial contaminated insulators, Na and Al elements can be used to characterize the equivalent salt deposit density (ESDD) and non-soluble deposit density (NSDD) levels respectively. For natural contaminated insulators, there are differences in spectral intensity of contaminated elements with different contamination years. And with the increase of the contamination years, the spectral intensity of the Si, Fe, Ca, Al, K and Na elements also have an increasing trend. Insulator samples under 4 contamination levels were classified based on the principal component analysis (PCA) algorithm. Dimension reduction analysis was conducted by extracting 6 excitation spectra (Si, Fe, Ca, Al, K, Na) which can represent contamination information. The 2 principal components with the largest contribution rate were obtained and the principal component scores of each spectrum were calculated. The research results showed that the spectral sample points have obvious convergence phenomenon according to the contamination level of the insulators. Compared with the commonly used methods for judging contamination level, LIBS technology has the advantages of easy operation, no sample processing and high sensitivity. Therefore, the combination of LIBS technology and PCA algorithm can save time and cost and improve the detection efficiency in the field of insulator contamination monitoring.
机译:作为电力系统中最重要的外部绝缘设备之一,绝缘子在输配电网络中发挥着重要作用。本文采用激光诱导击穿光谱法(LIBS)对人工污染绝缘子和自然污染绝缘子表面上的污染元素进行了定性和定量分析。对于人工污染的绝缘子,可以使用Na和Al元素分别表征等效盐沉积密度(ESDD)和非可溶性沉积密度(NSDD)的水平。对于天然受污染的绝缘子,受污染年限不同的受污染元素的光谱强度也存在差异。随着污染年限的增加,硅,铁,钙,铝,钾和钠元素的光谱强度也有增加的趋势。根据主成分分析(PCA)算法对4种污染水平下的绝缘子样品进行分类。通过提取可表示污染信息的6个激发光谱(Si,Fe,Ca,Al,K,Na)进行尺寸缩减分析。获得了贡献率最高的2个主成分,并计算了每个光谱的主成分得分。研究结果表明,根据绝缘子的污染程度,光谱采样点具有明显的收敛现象。与常用的污染水平判断方法相比,LIBS技术具有操作简便,无需样品处理,灵敏度高的优点。因此,LIBS技术与PCA算法的结合可以节省时间和成本,并提高绝缘子污染监测领域的检测效率。

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