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A Capture Safe Static Test Compaction Method Based on Don't Cares

机译:基于无关的捕获安全静态测试压缩方法

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In recent years, the number of test vectors has increased due to VLSI circuit density and complexity. A test compaction technique can reduce the number of test vectors without losing fault coverage. However, the number of transitioned signal lines per one test vector increases since each compacted test vector detects more faults. Therefore, excessive capture power consumption at scan testing causes the excessive IR drop and it might induce unnecessary yield loss. In this paper, we propose a static test compaction method which guarantees that generated test vectors are capture-safe.
机译:近年来,由于VLSI电路密度和复杂性,测试向量的数量增加了。测试压缩技术可以减少测试向量的数量,而不会丢失故障覆盖率。但是,由于每个压缩的测试矢量检测到更多的故障,因此每个测试矢量的转换信号线的数量增加了。因此,扫描测试时捕获功率消耗过多会导致IR下降过多,并可能导致不必要的良率损失。在本文中,我们提出了一种静态测试压缩方法,该方法可确保生成的测试向量是捕获安全的。

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