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The Application of Gate-Drain underlap Architecture in TFET-based Inverters

机译:栅漏下叠架构在基于TFET的逆变器中的应用

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In this paper, an L-shape tunnel field-effect transistor (LTFET) with gate-drain underlap (GDU-LTFET) is proposed to suppress the ambipolar behavior effectively and to optimize the TFET inverter circuit. As the GDU architecture changes the energy band of the junction between the channel region and the drain region, the GDU-LTFET has lower band-to-band tunneling (BTBT) rate compared with LTFET in the off-state, which helps to reduce static power consumption of TFET digital circuit. The simulation results show that the noise margin, voltage gain and static power consumption in the GDU-LTFET inverter perform better compared with that in the LTFET inverter.
机译:为了有效地抑制双极性行为并优化TFET逆变器电路,本文提出了一种具有栅极-漏极下重叠的L型隧道场效应晶体管(LTFET)。随着GDU架构改变沟道区和漏极区之间结的能带,与处于截止状态的LTFET相比,GDU-LTFET具有较低的带间隧穿(BTBT)速率,这有助于降低静电TFET数字电路的功耗。仿真结果表明,与LTFET逆变器相比,GDU-LTFET逆变器的噪声容限,电压增益和静态功耗更好。

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