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On Stability Analysis and Loop Oscillation of Multi-Finger GaN FET Cells for High Power Amplifiers

机译:大功率放大器多指GaN FET单元的稳定性分析和环路振荡

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Highly optimized multi-finger GaN HEMTs are prone to internal oscillations or odd-modes. Developing tools to detect and suppress these oscillations is of great help for GaN device designers. This manuscript proposes an internal oscillations detection technique based on a FET small-signal equivalent circuit coupled to Electromagnetic (EM) simulations. Then, a stability analysis technique is applied on the developed transfer function. The approach is demonstrated on three 8-finger cells using three different stability analysis techniques. All outcomes of the used stability techniques align which proves the accuracy of the developed approach.
机译:高度优化的多指GaN HEMT容易产生内部振荡或奇模。开发用于检测和抑制这些振荡的工具对GaN器件设计人员来说有很大的帮助。该手稿提出了一种基于FET小信号等效电路并耦合到电磁(EM)仿真的内部振荡检测技术。然后,将稳定性分析技术应用于已开发的传递函数。使用三种不同的稳定性分析技术在三个8指单元上演示了该方法。所使用的稳定性技术的所有结果都是一致的,这证明了所开发方法的准确性。

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