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Numerical Analysis on the Emissivity Determination of Microwave Calibration Targets by Scattering Measurements

机译:散射测量分析微波校准靶标的分析

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The calibration target is a vital instrument for calibrating the space-borne microwave radiometers. The calibration target is designed to be with a high emissivity close to 1, and its emissivity must be accurately determined before its practical usage. The emissivity of calibration target can be determined in the way of reflectivity measurement, in which the overall reflectivity has to be inferred based on the measured scattering in limited angular region. There are typical two setups in measuring the emissivity, one is the monostatic measurement and the other is the bi-static measurement. In this work, the authors discuss the remaining issues in the two measurement configurations, and report their recent progresses.
机译:校准目标是用于校准空间传播微波辐射仪的重要仪器。校准目标设计为具有接近1的高发射率,并且在其实际使用前必须准确地确定其发射率。校准目标的发射率可以以反射率测量的方式确定,其中必须基于在有限角度区域中的测量散射来推断出整体反射率。测量发射率有典型的两种设置,一个是单体测量,另一个是双静态测量。在这项工作中,作者讨论了两种测量配置中的剩余问题,并报告其最近的进展。

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