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The failure mechanism of electromagnetic relay in accelerated storage degradation testing

机译:电磁继电器在加速存储退化测试中的故障机理

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The most past research on storage reliability of electromagnetic relay (EMR) only focuses on the measurement of contact resistance. The relay time parameters which reflect main performance function were not monitored. So, in this study the relay time parameters and relay contact resistance were detected simultaneously. The method of prognostics and health management (PHM) was used. According to the analysis on test results of contact resistance, relay time parameters, the degradation phenomena of EMR in long-term storage are investigated, and the storage failure mechanism is analyzed. The microscopic morphology and changes in chemical elements for relay contact surface was analyzed, which provide references for the relay storage failure mechanisms.
机译:关于电磁继电器(EMR)的存储可靠性的最新研究仅集中在接触电阻的测量上。没有监视反映主要性能功能的继电器时间参数。因此,在这项研究中,同时检测了继电器时间参数和继电器接触电阻。使用了预后和健康管理(PHM)方法。通过对接触电阻,继电器时间参数,长期存储中EMR的退化现象的测试结果的分析,研究了存储失效的机理。分析了继电器触点表面的微观形态和化学元素的变化,为继电器存储失效机理提供了参考。

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