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Extremely High Temperature and High Pressure (x-HTHP) Endurable SOI Device and Sensor Packaging for Harsh Environment Applications

机译:适用于恶劣环境应用的极高温和高压(x-HTHP)耐久SOI器件和传感器包装

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There are increasing interest in high temperature endurable sensor or device packaging solution for a set of wide ranging applications that include oil and gas production or deep sea exploration, advanced automotive application, aerospace, more electric aircraft initiative (MEA) or engine health management (EHM) systems, geothermal energy harvesting as well as other renewable energy industries. Besides high temperature endurable capability of the electronic device, heavy industries such as oil and gas down-hole drilling or exploration, deep sea or geological survey applications which require additional capability to endure high ambient pressure with target reliability requirement of up to 250°C and 30Kpsi. A unique packaging solution is therefore required to address all the challenges associated with extreme high temperature and high pressure (x-HTHP) endurable electronics continuous operation in harsh x-HTHP ambient environment. In this paper, we demonstrated a packaging solution for sensor device with high reliability under harsh condition with extreme high temperature and high pressure through reliability test and finite element analysis.
机译:高温耐用的传感器或设备包装解决方案越来越受到关注,这些解决方案适用于一系列广泛的应用,包括油气生产或深海勘探,先进的汽车应用,航空航天,更多的电动飞机计划(MEA)或发动机健康管理(EHM) )系统,地热能收集以及其他可再生能源行业。除了电子设备的高温耐受能力外,重工业,例如油气井下钻井或勘探,深海或地质勘测应用,还需要额外的能力以承受高环境压力,目标可靠性要求高达250°C,并且30Kpsi。因此,需要一种独特的包装解决方案来应对与在严酷的x-HTHP环境中实现的极高的高温和高压(x-HTHP)持久性电子连续运行相关的所有挑战。在本文中,我们通过可靠性测试和有限元分析,展示了一种用于传感器设备的封装解决方案,该解决方案在苛刻条件下,极端高温和高压下具有高可靠性。

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