首页> 外文会议>Annual Conference of the IEEE Industrial Electronics Society >Determination of the power losses due to the nonlinear coss capacitance of SJ MOSFETs submitted to voltage transients in ZVS applications
【24h】

Determination of the power losses due to the nonlinear coss capacitance of SJ MOSFETs submitted to voltage transients in ZVS applications

机译:确定在ZVS应用中由于电压瞬变而导致的SJ MOSFET的非线性coss电容引起的功率损耗

获取原文

摘要

Effects of the parasitic capacitance Coss of MOSFET devices on soft-switching converters are investigated, especially in terms of power losses, considering that the influence of the nonlinearity of this parameter has been proved. An experimental workbench, which allow measuring the frequency and voltage dependence of the parasitic capacitance, has been realized. A comparison of different super junction devices in soft-switching converters is performed. Since the power losses related to the MOSFET output impedance are highly dependent on the application, a class-E resonant converter has been firstly designed, and then realized aiming to detect the power losses for this application. As forthcoming work, it could be useful to define a figure of merit for comparing different devices in soft-switching operations.
机译:考虑到已经证明了该参数的非线性影响,研究了MOSFET器件的寄生电容Coss对软开关转换器的影响,特别是在功率损耗方面。已经实现了允许测量寄生电容的频率和电压依赖性的实验工作台。进行了软开关转换器中不同超级结器件的比较。由于与MOSFET输出阻抗相关的功率损耗高度依赖于应用,因此,首先设计了E类谐振转换器,然后实现了旨在检测​​该应用的功率损耗的目的。即将进行的工作中,定义一个品质因数以比较软开关操作中的不同设备可能会很有用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号