An automated CAD tool for rapid technology characterization

摘要

In this paper an automated CAD tool for rapid technology characterization is presented. The proposed methodology fills the gap found in old, as well as, new IC desgin methdologies technology. The tool allows the user doing a rapid characterization for different devices models available in a technology. The tool is based on a pre-defined suite of test-benches in addition to SKILL code and OCEAN script to allow seamless integration of the tool in the design environment. Finally, a design example is presented using 130 nm CMOS technology using the tool; results are shown for MOSFET devices characterization.