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Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions

机译:辅导课程:消费电子产品的静电放电保护:挑战与解决方案

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Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event. As such, designing robust on-chip ESD structures to protect microchips against ESD stress is a high priority in the semiconductor industry. The continuing scaling of CMOS technology makes the ESD-induced failures even more prominent, and one can predict with certainty that the availability of effective and robust ESD protection solutions will be a critical factor to the success of the deep sub-micron technology advancement. In fact, many semiconductor companies worldwide are having difficulties in meeting the increasingly stringent ESD protection requirements for various electronics applications. There has been a wide spread use of integrated circuits in consumer applications. An example is the automotive electronics which are typically operated in a voltage range of 40-60 9. This relatively high-voltage operation imposes certain challenges to the design of ESD protection solutions embedded in the modern vehicles. On the other hand, due to the huge market of civil wireless communications, low-voltage integrated circuits are also in high demands. Effective ESD protection solutions for these high-speed circuits are typically required to operate within a very narrow ESD design window and with a minimal loading effect (i.e., high transparency), hence introducing a different set of challenges. This talk gives a comprehensive coverage on challenges and solutions pertinent to ESD protection of highand low-voltage IC's utilized in various consumer electronics.
机译:静电放电(ESD)是对电子组件可靠性最普遍的威胁之一。这是将有限量的电荷从一个物体(即人体)转移到另一物体(即微芯片)的事件。此过程可能会导致非常高的电流在非常短的时间内流经微芯片,并且这种事件可导致超过35%的芯片损坏。因此,在半导体行业中,设计健壮的片上ESD结构以保护微芯片免受ESD应力是当务之急。 CMOS技术的不断扩展使ESD引起的故障更加突出,并且可以肯定地预测到,有效而强大的ESD保护解决方案的可用性将成为深亚微米技术发展成功的关键因素。实际上,全球许多半导体公司都难以满足各种电子应用日益严格的ESD保护要求。集成电路在消费类应用中得到了广泛的应用。一个例子是汽车电子设备,其通常在40-60 9的电压范围内工作。这种相对较高的电压工作对现代车辆中嵌入的ESD保护解决方案的设计提出了某些挑战。另一方面,由于民用无线通信的巨大市场,对低压集成电路也有很高的要求。通常需要用于这些高速电路的有效ESD保护解决方案,以使其在非常狭窄的ESD设计窗口内并且具有最小的负载效应(即,高透明性),从而带来了一系列不同的挑战。该演讲全面涵盖了与各种消费电子产品中使用的高低压IC的ESD保护相关的挑战和解决方案。

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