首页> 外文会议>International Symposium on Discharges and Electrical Insulation in Vacuum >Influence of magnetic fields on inrush current prestrike arc behaviors of vacuum interrupters
【24h】

Influence of magnetic fields on inrush current prestrike arc behaviors of vacuum interrupters

机译:磁场对真空灭弧室涌流预激电弧行为的影响

获取原文
获取外文期刊封面目录资料

摘要

In the case of back-to-back capacitor banks switching, the inrush current arcs can locally melt the contact surfaces of interrupters during prestrike processes. The magnetic field of the contact would influence the behaviors of the inrush current prestrike arcs. The objective of this paper is to determine the influences of cup-type transverse magnetic field (TMF) and cup-type axial magnetic field (AMF) contacts on prestrike arc behaviors of vacuum interrupters (VIs) during capacitive making processes. The inrush current arc behaviors were observed by a high-speed camera. The contact diameter of the VIs was 48 mm. The insulating envelope of the VIs was transparent and there was no metal vapor shield inside the VIs for observation of prestrike arcs. Two types of cup-type vacuum interrupter contacts with different magnetic field structures (TMF and AMF) were used. The prestrike arc observations indicate that the cup-type AMF contacts are superior than the cup-type TMF contacts because of less damages of the prestrike arcs to the contact surfaces.
机译:在背对背电容器组切换的情况下,在预触击过程中,浪涌电流电弧会局部熔化断路器的接触表面。触点的磁场会影响突入电流预激弧的行为。本文的目的是确定在电容性制造过程中杯型横向磁场(TMF)和杯型轴向磁场(AMF)接触对真空灭弧室(VIs)的预触电弧性能的影响。高速相机观察到了浪涌电流电弧行为。 VI的接触直径为48mm。 VI的绝缘外壳是透明的,VI内没有用于观察预击电弧的金属蒸气屏蔽。使用了两种具有不同磁场结构的杯型真空灭弧室触头(TMF和AMF)。预击电弧的观察结果表明,杯形AMF触点优于杯形TMF触点,因为预击电弧对接触面的损坏较小。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号