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Calibration of timing mismatch in a two-channels time-interleaved ADC based on testing signal and its verification on FPGA

机译:基于测试信号的两通道时间交错ADC时序失配的校准及其在FPGA上的验证

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The multi-channel time-interleaved analog-to-digital converter (TIADC) makes creating high-resolution and high-speed ADC possible. This paper adopts a known low frequency sinusoidal test signal and the FxLMS algorithm to calibrate the timing mismatches in a two-channel TIADC. By adopting this method, the timing error which is centralized in the mid-frequency band can be easily corrected. This calibration algorithm requires a slightly oversampled input signal to produce a mismatch band. Through the numerical simulation in MATLAB and the measurement on a FPGA testing board, the validity of this calibration technique was proved.
机译:多通道时间交错的模数转换器(TIADC)使创建高分辨率和高速ADC成为可能。本文采用已知的低频正弦测试信号和FxLMS算法来校准两通道TIADC中的时序失配。通过采用这种方法,可以容易地校正集中在中频带的定时误差。该校准算法需要稍微过采样的输入信号才能产生失配带。通过在MATLAB中进行数值模拟和在FPGA测试板上进行测量,证明了该校准技术的有效性。

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