In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.
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