Reliability demonstration of High Performance Power Supply after IC vendor replacement

摘要

One of the key parameters of each complex system, either power electronic converter and personal computer is reliability. “Element re-usage”, which means that only known, tested components are used in order to increase the reliability of a complex system, is one of the most important rules among many foundations of reliability engineering. As it is easy to understand, such an approach makes any cost optimization extremely difficult. In this paper, a time- and cost-efficient approach for accelerated reliability testing of a power converter critical components is presented. The described test was intended to prove that even relatively insignificant change – e.g. the manufacturer of Metal-Oxide Semiconductor Field-Effect Transistor (MOSFET) driver would not affect negatively the reliability of power supplies for plasma sputtering manufactured in TRUMPF Huettinger.