An Improved Fast Self-Comparison Algorithm for High-Speed Defect Detection of ITO Circuits

摘要

For PCTP ITO circuit defect detection based on template matching, usually the templates in DXF format cannot be used directly. Because the sensed images will be deformed, then the effectiveness of comparison algorithm will be adversely affected. Based on FFT a self-comparison algorithm for high-speed defect detection of ITO circuit in PCTP is developed in which a faultless template is extracted from sensed images. 1-D FFT and 2-D FFT are compared for the practicability, and the effectiveness of the algorithm is analyzed for the detection of sensed images with different brightness. The experiment results show this algorithm is applicable and fast.