Electro-Acoustic Reflectometry, a new method toward very high spatial resolution space charge measurements

摘要

One of the challenges in the area of space charge measurements in dielectric materials is reaching a high spatial resolution without destroying the sample. In this work we propose a new method: Electro-Acoustic Reflectometry (EAR). It measures reflection from the sample when stressed by voltage and deals with signals in frequency domain. It is tested on a 9 μm thick PVDF sample. The primary obtained results show 1.2 μm resolution but it is possible to push the limit of spatial resolution very far.