IMPROVEMENTS OF THE SI-TRACEABLE CALIBRATION OF THE SHORT CIRCUIT CURRENT OF MULTI JUNCTION COMPONENT SOLAR CELLS

摘要

To improve the metrology in the field of Ⅲ-Ⅴ semiconductor based multi-junction solar cells (MJSC) several national metrology institutes of European countries cooperate in the joint research project SolCell. One focus of the project is the reduction of the calibration uncertainty for MJSC and the establishment of Differential Spectral Responsivity (DSR) measurements as a primary calibration method to avoid expensive balloon flight based MJSC calibrations. In this work the results of a comparative study of calibration facilities for MJSC is presented where sun simulator calibrations are compared to Laser based Differential Spectral Responsivity (Laser-DSR) calibrations. Also the linearity of the solar cell's photo current in dependence of irradiation as well as the temperature dependence of the device's open circuit voltage have been investigated. A reduction of the measurement uncertainty of the spectral responsivity of the samples from 1 % to 0.5 % was reached.