Visualization of Charge Carrier Motion in Semiconductor Nanowires with Ultrafast Pump-Probe Microscopy

摘要

Femtosecond pump-probe microscopy is used to directly visualize the diffusion of photogenerated charge carriers in undoped silicon nanowires, as well as charge separation in a nanowire encoded with an axial p-type/intrinsic-type (p-i-n) junction.