【24h】

Features of Hgx−1CdxTe anodic sulfdization

机译:Hg x-1 Cd x Te阳极硫化的特征

获取原文

摘要

Processes of thin sulfde layers on HgCdTe surface formation by anodic sulfdization were investigated in this work. 0.1M NaS in ethylene glycol solution was used as an electrolyte. Potentiodynamic curves obtained do not correspond with expected ones from literature [1], but qualitatively represent electrochemical processes occurring — formation of cadmium, tellurium and mercury sulfdes. Galvanostatic dependencies verify formation of non-insulating flms a composition of which depends on anodization duration. Analysis of the surface chemical composition by XPS has shown that the main components of sulfde flms formed are cadmium and mercury sulfdes, with tellurium sulfde nearly absenting. The model of sulfde layer formation based on experimental data obtained has been proposed. Voltage-current (I-V) characteristics of Au-native sulfde-HgCdTe structures being rectifying were obtained and analyzed.
机译:在这项工作中,研究了通过阳极硫化在HgCdTe表面形成薄硫化层的过程。乙二醇溶液中的0.1M NaS用作电解质。所获得的电位动力学曲线与文献[1]所预期的不符,但定性地表示发生的电化学过程-镉,碲和汞的硫化物的形成。恒电流依赖性验证了非绝缘膜的形成,其组成取决于阳极氧化持续时间。 XPS对表面化学成分的分析表明,形成的硫化物碎片的主要成分是镉和汞的硫化物,几乎不存在碲化的碲。提出了基于获得的实验数据的硫化物层形成模型。获得并分析了正在被整流的Au-天然硫化物-HgCdTe结构的电压-电流(I-V)特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号