The influence of gas leakage through penetrated holes introduced during fabrication was experimentally evaluated using in-situ Raman scattering spectroscopy. Gas chromatography analysis of pressure differences between the anode and the cathode revealed that the gas leakage through the holes was dominated by gas diffusion through the anode, and that the pressure difference did not influence the amount of gas leakage. In-situ measurements in an operated cell with a hole revealed combustion between leaked H_2 and air occurred around the hole, the O_2 partial pressure at this hole was not sufficiently low to reduce NiO, and the temperature increased by almost 10°C around the hole. In contrast, no influence on stress distributions was observed.
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