Efficient computation of the Strehl ratio for the wavefront coding system with the rotationally symmetric phase mask

摘要

The Strehl ratio (SR) describes the ratio of the on-axis intensity between the aberrated system and the diffraction limited system. It can be used to build the merit function for the optimization of phase mask in the wavefront coding system. We propose a computationally efficient method for the SR and use it to compute the SR with different defocus errors for the wavefront coding system using the rotationally symmetric phase mask. With this method, the computation efficiency of the merit function can be improved greatly in the optimization of the rotationally symmetric phase mask.