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A cascade method for TFT-LCD defect detection

机译:用于TFT-LCD缺陷检测的级联方法

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In this paper, we propose a novel cascade detection algorithm which focuses on point and line defects on TFT-LCD. At the first step of the algorithm, we use the gray level difference of su-bimage to segment the abnormal area. The second step is based on phase only transform (POT) which corresponds to the Discrete Fourier Transform (DFT), normalized by the magnitude. It can remove regularities like texture and noise. After that, we improve the method of setting regions of interest (ROI) with the method of edge segmentation and polar transformation. The algorithm has outstanding performance in both computation speed and accuracy. It can solve most of the defect detections including dark point, light point, dark line, etc.
机译:在本文中,我们提出了一种新的级联检测算法,专注于TFT-LCD上的点和线缺陷。在算法的第一步,我们使用Su-Bimage的灰度级别来分割异常区域。第二步骤基于仅相位变换(POT),其对应于离散的傅里叶变换(DFT),由幅度归一化。它可以去除像纹理和噪音等规律。之后,我们通过边缘分割和极性转换方法来改善利益区域(ROI)的方法。该算法以计算速度和精度具有出色的性能。它可以解决大部分缺陷检测,包括暗点,光点,暗线等。

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