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Evaluation of optical parameters of quasi-parallel plates with single-frame interferogram analysis methods and eliminating the influence of camera parasitic fringes

机译:用单帧干涉图分析方法评估准平行板的光学参数,并消除照相机寄生条纹的影响

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The surface flatness of transparent plates is frequently tested in Fizeau and Twyman-Green interferometers. In case of quasi-parallel plates, however, a common problem is the additional reflection from the plate rear surface and the occurence of three-beam interference. Conventional methods of interferogram analysis such as temporal phase shifting or Fourier transform fail when the three overlapping fringe sets are present in the image. Our method of deriving optical parameters of the plate requires recording two interferograms: a two-beam interferogram without a reference beam and the three-beam interference one. The images are processed using single-frame techniques only and information about shape of both surfaces and optical thickness variations of the plate is retrieved. Unwanted parasitic fringes introduced by the glass plate protecting the CCD matrix in the camera are also handled using recently developed special smoothing technique. The proposed method is based on algorithmic solution and does not require modification of a sample or the optical setup. The measurement procedure and the detailed image processing path will be presented on the example of quasi-parallel plate interferograms recorded in the Twyman-Green setup.
机译:透明板的表面平整度经常在Fizeau和Twyman-Green干涉仪中进行测试。然而,在准平行板的情况下,一个共同的问题是板后表面的额外反射以及三光束干涉的发生。当图像中存在三个重叠条纹集时,干涉图分析的常规方法(例如时间相移或傅里叶变换)将失败。我们得出板的光学参数的方法需要记录两个干涉图:一个没有参考光束的两光束干涉图和一个三光束干涉图。仅使用单帧技术处理图像,并获取有关两个表面的形状和板的光学厚度变化的信息。使用最近开发的特殊平滑技术还可以处理保护照相机中CCD矩阵的玻璃板引入的有害寄生条纹。所提出的方法基于算法解决方案,不需要修改样本或光学设置。测量程序和详细的图像处理路径将以Twyman-Green装置中记录的准平行平板干涉图为例进行介绍。

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