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An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

机译:具有半桥结构的电力电子硬盘故障检测杂散电压捕获的延伸

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A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure.
机译:如果短路路径中存在额外的杂散电感,则基于杂散电压捕获(SVC)的短路检测不能鲁棒地检测硬开关故障(HSF)。因此,本文提出了基于SVC输出的集成来检测HSF的杂散电压捕获(ESVC)方法的延伸。结果表明,在MOSFET线性区域中检测到HSF,并且可以在具有半桥结构的任何转换器中容易地实现。

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