Test Technology on CCD Anti-sunlight Jamming Based on Complex Circumstance

摘要

Visible-light reconnaissance device based on CCD is applied to all kinds of weapons, CCD cann't work because of saturation when it faces intense light. Sun is intense light source in nature and assignably influences CCD performance. In this paper, aim is appraising CCD anti-sunlight ability, object reflection characteristic test system is designed, based on typical background reflection characteristic including grant, sand and so on, complex circumstance is formulated and test project is optimized with orthogonal design method, problem that is without test technology on CCD anti-sunlight jamming is solved.