Extraction of Constitutive Effective Parameters for Reflective Metasurfaces Using Simplex S-Parameters

摘要

In this work, aiming at reflective metasurfaces, an innovative method based on a one-port network model is proposed to retrieve the constitutive effective parameters (CEPs) only using S11. The theory is demonstrated by calculating the CEPs for different incident angles and multiple-layer metasurfaces. The results match well with each other.