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Using Register Lifetime Predictions to Protect Register Files Against Soft Errors

机译:使用寄存器生命周期预测来保护寄存器文件免受软错误

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To increase the resistance of register files to soft errors, this paper presents the ParShield architecture. ParShield is based on two observations: (i) the data in a register is only useful for a small fraction of the register's lifetime, and (ii) not all registers are equally vulnerable. ParShield selectively protects registers by generating, storing, and checking the ECCs of only the most vulnerable registers while they contain useful data. In addition, it stores a parity bit for all the registers, re-using the ECC circuitry for parity generation and checking. ParShield has no SDC AVF and a small average DUE AVF of 0.040 and 0.010 for the integer and floating-point register files, respectively. ParShield consumes on average only 81% and 78% of the power of a design with full ECC for the SPECint and SPECfp applications, respectively. Finally, ParShield has no performance impact and little area requirements.
机译:为了增加寄存器文件的阻力,介绍了ParShield架构。 Parshield基于两个观察:(i)寄存器中的数据仅对寄存器的寿命的一小部分有用,并且(ii)并非所有寄存器都同样脆弱。 ParShield通过生成,存储和检查仅包含最易受攻击的寄存器的ECC来选择性地保护寄存器,同时包含有用的数据。此外,它存储所有寄存器的奇偶校验位,重新使用ECC电路进行奇偶校验生成和检查。 ParShield分别没有SDC AVF,分别为整数和浮点寄存器文件分别为0.040和0.010的小平均到期AVF。 ParShield平均仅消耗81%和78%的设计功能,分别为SPECINT和SPECFP应用程序具有全ECC。最后,Parshield没有表现影响和区域要求。

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