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A sub-pixel resolution method for chromosome band profile extraction

机译:一种用于染色体带轮廓提取的子像素分辨率方法

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Chromosome classification is the essential task of karyotyping analysis which is videly used for detecting genetic anomalities. Chromosomes' band profiles based feature vectors are used frequently in the classification of them. Extracting of band profiles specially in the bent parts of chromosome may be lossy. In this study, an special sub-pixel resolution based method for lossless exctraction of chromosomes' band profile is proposed. This method models the skeleton of chromosomes as piece-wise linear equations using normal lines to the chromosome boundary. Based on the obtained model, extracting of band profiles is done by forming the skeleton normal lines in the sub-pixel resolution. For evaluation the accuracy of band profile extraction, a measure defined as "Percent of Band Profile Loss" demonstrates the proposed method as an alternative method which results to lossless chromosome band profile extraction.
机译:染色体分类是核型分类分析的基本任务,其易于用于检测遗传异常。基于染色体的频带简档的特征向量在它们的分类中经常使用。特别是在染色体弯曲部件中的带曲线的提取可能有损。在该研究中,提出了一种基于特殊的子像素分辨率,用于染色体带简档的无损exctraction。该方法将染色体的骨架模拟为使用普通线到染色体边界的明智的线性方程。基于所获得的模型,通过在子像素分辨率中形成骨架普通线来完成频带轮廓的提取。为了评估带简档提取的准确性,定义为“频带损耗百分比”的度量证明了所提出的方法作为导致无损染色体带轮廓提取的替代方法。

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