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DETERMINATION OF LIGHT ELEMENTS IN STEEL AND MINERALS USING WDS ON SEM

机译:在SEM上使用WDS测定钢和矿物质中的轻质元素

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Microanalysis by using scanning electron microscopes (SEM) is widespread in materials related sciences and industries. Due to its versatility, robustness and speed energy-dispersive X-ray spectrometry (EDS) is thereby widely-used and appropriate for the majority of analytical applications. For more demanding tasks however, requiring higher spectral resolution and trace element detection capabilities beyond the limits of EDS, wavelength-dispersive X-ray spectrometry (WDS) is the ideal technique for gaining even more precise data during microanalysis. A parallel beam WD spectrometer with grazing incidence collimating optics furthermore delivers outstanding sensitivity in the low-energy range of X-ray lines, facilitating the determination of light elements. Here, we present measurements of light elements including Be, B, C, N carried out on various steel, glass and mineral samples. The present WDS analyses for light elements were performed on a FE-SEM using Bruker's parallel beam WD spectrometer XSense? equipped with various multilayer dispersing elements. Amongst others, the present study shows results on boron quantification in glasses and on heterogeneous carbon distribution in steel. Three different industrial glasses with boron contents between ca. 2 wt% and 10 wt% were measured under (a) high-vacuum, and (b) low-vacuum (30 Pa) conditions. In order to avoid beam damage, the analysed areas were 30x20 μm in size. Boron was determined by WDS using an 80 A multilayer, all other elements by standardless EDS. A certified DURAN glass with 13 wt% B_2O_3 was used as reference material. The results of both analyses series (at high- and low-vacuum) are in good agreement with data gathered by XRF analysis of the samples. Mapping of carbon distribution in a steel sample (DP600; sample courtesy of Prof. M.G.D. Geers, Eindhoven University of Technology) has shown that a parallel-beam WDS on SEM is a powerful tool for distinguishing phases with only low but distinct carbon contents. In the investigated steel, martensite with carbon contents of 0.3 wt% can easily be distinguished by means of mapping from ferrite with carbon contents of 0.01 wt% (Fig. 1). We experienced that instantaneous carbon contamination is a severe problem during measurement. Advisable prerequisites for high quality carbon determinations are therefore: (1) strictly oil free vacuum, (2) a plasma cleaner, (3) an air jet, and (4) a cool finger (LN2).
机译:使用扫描电子显微镜(SEM)微扫描在材料相关科学和行业中广泛。由其多功能性,鲁棒性和速度能量 - 分散X射线光谱法(EDS)由此广泛使用,适用于大多数分析应用。然而,对于更苛刻的任务然而,需要高于EDS的极限的频谱分辨率和痕量元素检测能力,波长分散X射线光谱(WDS)是在微观分析期间获得更精确的数据的理想技术。具有放牧入射准直光学器件的平行光束WD光谱仪还在X射线线的低能量范围内提供出色的灵敏度,便于光元件的确定。这里,我们呈现了在各种钢,玻璃和矿物样品上进行的光元件的测量,包括B,C,N.使用Bruker的并联光束WD光谱仪XSense对Fe-SEM进行光元素的本地WDS分析?配备各种多层分散元件。其中,本研究表明,硼量化的硼量化和钢中的异构碳分布结果。三种不同的工业镜片与硼含量在ca之间。在(a)高真空下测量2wt%和10wt%,(b)低真空(30pa)条件。为了避免光束损坏,分析的区域的尺寸为30x20μm。通过WDS使用80多层,通过标准EDS的所有其他元素确定硼。使用13wt%B_2O_3的经认证的Duran玻璃用作参考材料。分析系列(在高真空和低真空)的结果与样品XRF分析收集的数据一致。钢样品中的碳分布映射(DP600; eindha.d.Geers教授的样本,埃因霍温大学技术教授)表明SEM上的并联梁WDS是一个强大的工具,用于区分阶段,仅具有低但不同的碳内容物。在所研究的钢中,通过从铁氧体的绘制,可以容易地区分用碳含量为0.3wt%的马氏体,碳含量为0.01wt%(图1)。我们经历了瞬时碳污染在测量期间是一个严重的问题。因此,高质量的碳测定的可明智的先决条件:(1)严格无油真空,(2)等离子体清洁剂,(3)空气喷射,(4)冷手指(LN2)。

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