Storage Reliability Assessment for Missile-borne Electronic Products with Small Sampling Based on Bayes Theorem

摘要

Based on the characteristic of small sampling of missile-borne electronic product, the life distribution form, the essential prior data and Storage Reliability composition of Missile-borne electronics products are firstly analyzed; after that, a new assessment algorithm of storage reliability based on Bayes theorem is presented, and the implementing steps of the algorithm are studied in detail, and then the point estimation and one-sided confidence lower limit of the storage reliability are provided. At last an example is given to shown validity of the method.